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[2] I. Demchenko, Y. Melikhov, Y. Syryanyy, I. Zaytseva, P. Konstantynov, M. Chernyshova, Effect of argon sputtering on XPS depth profiling results of Si/Nb/Si. Journal of Electron Spectroscopy and Related Phenomena (2018) 224, 17-22

[3] I. Demchenko, Y. Syryanyy, Y. Melikhov, L. Nittler, L. Gladczuk, K. Lasek, L. Cozzarini, M. Dalmiglio, A. Goldoni, P. Konstantynov, M. Chernyshova, X ray photoelectron spectroscopy analysis as a tool to assess factors influencing magnetic anisotropy type in Co/MgO system with gold interlayer. Scripta Materialia (2018) 145, 50-53

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Projekty badawcze realizowane przez IFPiLM są finansowane ze środków Ministerstwa Nauki i Szkolnictwa Wyższego i Narodowego Centrum Nauki oraz ze środków Komisji Europejskiej na podstawie umowy grantowej No 633053, w ramach Konsorcjum EUROfusion. Wsparcia finansowego udzielają także: Międzynarodowa Agencja Energii Atomowej, Agencja Fusion for Energy, Europejska Agencja Kosmiczna i Konsorcjum LaserLab.